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dc.contributor.authorLin, YCen_US
dc.contributor.authorChang, EYen_US
dc.contributor.authorChen, GJen_US
dc.contributor.authorLee, HMen_US
dc.contributor.authorHuang, GWen_US
dc.contributor.authorBiswas, Den_US
dc.contributor.authorChang, CYen_US
dc.date.accessioned2014-12-08T15:38:58Z-
dc.date.available2014-12-08T15:38:58Z-
dc.date.issued2004-06-10en_US
dc.identifier.issn0013-5194en_US
dc.identifier.urihttp://dx.doi.org/10.1049/el:20040458en_US
dc.identifier.urihttp://hdl.handle.net/11536/26677-
dc.description.abstractA low noise InGaP/InGaAs pseudomorphic high-electron-mobility transistor (PHEMT) with high IN was developed. The device utilises InGaP as the Schottky layer to achieve a low noise figure and uses AlGaAs as the spacer to reform the electron mobility and contains dual delta doped layers to improve the device linearity.en_US
dc.language.isoen_USen_US
dc.titleInGaP/InGaAs PHEMT with high IP3 for low noise applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1049/el:20040458en_US
dc.identifier.journalELECTRONICS LETTERSen_US
dc.citation.volume40en_US
dc.citation.issue12en_US
dc.citation.spage777en_US
dc.citation.epage778en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department友訊交大聯合研發中心zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentD Link NCTU Joint Res Ctren_US
dc.identifier.wosnumberWOS:000222386200044-
dc.citation.woscount6-
Appears in Collections:Articles


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