標題: Self-Matched ESD Cell in CMOS Technology for 60-GHz Broadband RF Applications
作者: Lin, Chun-Yu
Chu, Li-Wei
Ker, Ming-Dou
Lu, Tse-Hua
Hung, Ping-Fang
Li, Hsiao-Chun
交大名義發表
National Chiao Tung University
關鍵字: Broadband;electrostatic discharge (ESD);ESD cell;V-band;60 GHz
公開日期: 2010
摘要: A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Omega input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.
URI: http://hdl.handle.net/11536/26743
http://dx.doi.org/10.1109/RFIC.2010.5477291
ISBN: 978-1-4244-6241-4
ISSN: 1529-2517
DOI: 10.1109/RFIC.2010.5477291
期刊: 2010 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS RFIC SYMPOSIUM
起始頁: 573
結束頁: 576
Appears in Collections:Conferences Paper


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