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dc.contributor.authorChu, SCen_US
dc.contributor.authorChern, JLen_US
dc.date.accessioned2014-12-08T15:39:10Z-
dc.date.available2014-12-08T15:39:10Z-
dc.date.issued2004-05-15en_US
dc.identifier.issn0146-9592en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OL.29.001045en_US
dc.identifier.urihttp://hdl.handle.net/11536/26771-
dc.description.abstractThe dynamic signature of the subwavelength variation of a slit is shown to be determinable from far-field irradiance with a precision of better than 1 nm. One can increase the efficiency of measurement of the subwavelength's signature by adjusting the detection width over which the subwavelength variation is detected. The subwavelength variation of a rectangular aperture was also examined to show the general feasibility. (C) 2004 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleCharacterization of the signature of subwavelength variation from far-field irradianceen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OL.29.001045en_US
dc.identifier.journalOPTICS LETTERSen_US
dc.citation.volume29en_US
dc.citation.issue10en_US
dc.citation.spage1045en_US
dc.citation.epage1047en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000221189400001-
dc.citation.woscount6-
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