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dc.contributor.authorChu, CFen_US
dc.contributor.authorLai, FIen_US
dc.contributor.authorChu, JTen_US
dc.contributor.authorYu, CCen_US
dc.contributor.authorLin, CFen_US
dc.contributor.authorKuo, HCen_US
dc.contributor.authorWang, SCen_US
dc.date.accessioned2014-12-08T15:39:20Z-
dc.date.available2014-12-08T15:39:20Z-
dc.date.issued2004-04-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1651338en_US
dc.identifier.urihttp://hdl.handle.net/11536/26868-
dc.description.abstractThe fabrication process and performance characteristics of the laser lift-off (LLO) GaN light-emitting diodes (LEDs) were investigated. The LLO-GaN LEDs were fabricated by lifting off the GaN LED wafer structure grown on the original sapphire substrate by a KrF excimer laser at 248 nm wavelength with the laser fluence of 0.6 J/cm2 and transferring it onto a Cu substrate. The LLO-GaN LEDs on Cu show a nearly four-fold increase in the light output power over the regular LLO-LEDs on the sapphire substrate. High operation current up to 400 mA for the LLO-LEDs on Cu was also demonstrated. Based on the emission wavelength shift with the operating current data, the LLO-LEDs on Cu show an estimated improvement of heat dissipation capacities by nearly four times over the light-emitting devices on sapphire substrate. The LLO process should be applicable to other GaN-based LEDs in particular for those high light output power and high operation current devices. (C) 2004 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleStudy of GaN light-emitting diodes fabricated by laser lift-off techniqueen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.1651338en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume95en_US
dc.citation.issue8en_US
dc.citation.spage3916en_US
dc.citation.epage3922en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000220586100007-
dc.citation.woscount91-
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