Title: Light-output enhancement of nano-roughened GaN laser lift-off light-emitting diodes formed by ICP dry etching
Authors: Kao, Chih-Chiang
Kuo, H. C.
Yeh, K. F.
Chu, J. T.
Peng, W. L.
Huang, H. W.
Lu, T. C.
Wang, S. C.
光電工程學系
Department of Photonics
Keywords: GaN;laser lift-off (LLO);light-emitting diode (LED);light extraction efficiency;nano-roughened surface
Issue Date: 1-May-2007
Abstract: In this paper, we report the fabrication and characteristics of nano-roughened GaN laser lift-off (LLO) light-emitting diodes (LEDs) with different scale surface roughness. The surface roughness of devices was controlled by inductively coupled plasma reactive inn etching. Using this fabrication method to form nanoscaled roughness, the electrical property was almost not degraded. Furthermore, the light-output power and wall-plug efficiency of LLO LED could be both significantly enhanced about two times using this simple method.
URI: http://dx.doi.org/10.1109/LPT.2007.897455
http://hdl.handle.net/11536/10870
ISSN: 1041-1135
DOI: 10.1109/LPT.2007.897455
Journal: IEEE PHOTONICS TECHNOLOGY LETTERS
Volume: 19
Issue: 9-12
Begin Page: 849
End Page: 851
Appears in Collections:Articles


Files in This Item:

  1. 000247353100072.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.