标题: | Light-output enhancement of nano-roughened GaN laser lift-off light-emitting diodes formed by ICP dry etching |
作者: | Kao, Chih-Chiang Kuo, H. C. Yeh, K. F. Chu, J. T. Peng, W. L. Huang, H. W. Lu, T. C. Wang, S. C. 光电工程学系 Department of Photonics |
关键字: | GaN;laser lift-off (LLO);light-emitting diode (LED);light extraction efficiency;nano-roughened surface |
公开日期: | 1-五月-2007 |
摘要: | In this paper, we report the fabrication and characteristics of nano-roughened GaN laser lift-off (LLO) light-emitting diodes (LEDs) with different scale surface roughness. The surface roughness of devices was controlled by inductively coupled plasma reactive inn etching. Using this fabrication method to form nanoscaled roughness, the electrical property was almost not degraded. Furthermore, the light-output power and wall-plug efficiency of LLO LED could be both significantly enhanced about two times using this simple method. |
URI: | http://dx.doi.org/10.1109/LPT.2007.897455 http://hdl.handle.net/11536/10870 |
ISSN: | 1041-1135 |
DOI: | 10.1109/LPT.2007.897455 |
期刊: | IEEE PHOTONICS TECHNOLOGY LETTERS |
Volume: | 19 |
Issue: | 9-12 |
起始页: | 849 |
结束页: | 851 |
显示于类别: | Articles |
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