标题: Light-output enhancement of nano-roughened GaN laser lift-off light-emitting diodes formed by ICP dry etching
作者: Kao, Chih-Chiang
Kuo, H. C.
Yeh, K. F.
Chu, J. T.
Peng, W. L.
Huang, H. W.
Lu, T. C.
Wang, S. C.
光电工程学系
Department of Photonics
关键字: GaN;laser lift-off (LLO);light-emitting diode (LED);light extraction efficiency;nano-roughened surface
公开日期: 1-五月-2007
摘要: In this paper, we report the fabrication and characteristics of nano-roughened GaN laser lift-off (LLO) light-emitting diodes (LEDs) with different scale surface roughness. The surface roughness of devices was controlled by inductively coupled plasma reactive inn etching. Using this fabrication method to form nanoscaled roughness, the electrical property was almost not degraded. Furthermore, the light-output power and wall-plug efficiency of LLO LED could be both significantly enhanced about two times using this simple method.
URI: http://dx.doi.org/10.1109/LPT.2007.897455
http://hdl.handle.net/11536/10870
ISSN: 1041-1135
DOI: 10.1109/LPT.2007.897455
期刊: IEEE PHOTONICS TECHNOLOGY LETTERS
Volume: 19
Issue: 9-12
起始页: 849
结束页: 851
显示于类别:Articles


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