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dc.contributor.authorWang, JSen_US
dc.contributor.authorKovsh, ARen_US
dc.contributor.authorHsiao, RSen_US
dc.contributor.authorChen, LPen_US
dc.contributor.authorChen, JFen_US
dc.contributor.authorLay, TSen_US
dc.contributor.authorChi, JYen_US
dc.date.accessioned2014-12-08T15:39:36Z-
dc.date.available2014-12-08T15:39:36Z-
dc.date.issued2004-02-15en_US
dc.identifier.issn0022-0248en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.jcrysgro.2003.09.053en_US
dc.identifier.urihttp://hdl.handle.net/11536/27033-
dc.description.abstractThe growth of high nitrogen content InGaAsN/GaAs single quantum well (SQW) for 1.55 mum applications on GaAs substrates using solid source molecular beam epitaxy and radio frequency plasma nitrogen source is reported. The nitrogen composition was determined using an X-ray diffractometer combined with dynamic simulation. The crystal and optical qualities of highly strained InGaAs/GaAs SQW grown at low temperature can be significantly improved by nitrogen incorporation due to reducing the lattice mismatch. Without the formation of additional nonradiative recombination in InGaAsN SQW with nitrogen composition up to 4.1% which corresponds to wavelength of 1.46 mum was achieved. The longest room-temperature PL peak wavelength obtained in this study is 1.59 mum by increasing the nitrogen composition up to 5.3%. And, the photoluminescence intensity of high nitrogen content InGaAsN SQW can be improved significantly by decreasing the growth temperature due to suppression of the phase separation of InGaAsN alloy. Our results show the potential for the fabrication of 1.55 mum InGaAsN QW lasers on GaAs substrates. (C) 2003 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectmolecular beam epitaxyen_US
dc.subjectnitridesen_US
dc.subjectsemiconducting III-V materialsen_US
dc.titleHigh nitrogen content InGaAsN/GaAs single quantum well for 1.55 mu m applications grown by molecular beam epitaxyen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.jcrysgro.2003.09.053en_US
dc.identifier.journalJOURNAL OF CRYSTAL GROWTHen_US
dc.citation.volume262en_US
dc.citation.issue1-4en_US
dc.citation.spage84en_US
dc.citation.epage88en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000189098700012-
dc.citation.woscount17-
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