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dc.contributor.authorLing, H. S.en_US
dc.contributor.authorWang, S. Y.en_US
dc.contributor.authorLee, C. P.en_US
dc.contributor.authorLo, M. C.en_US
dc.date.accessioned2014-12-08T15:40:04Z-
dc.date.available2014-12-08T15:40:04Z-
dc.date.issued2009-11-01en_US
dc.identifier.issn1350-4495en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.infrared.2009.05.026en_US
dc.identifier.urihttp://hdl.handle.net/11536/27365-
dc.description.abstractLWIR InAs/Al(0.3)Ga(0.7)As/In(0.15)Ga(0.85)As confinement-enhanced DWELL (CE-DWELL) QDIPs with operation temperatures higher than 200 K are reported. A thin Al(0.3)Ga(0.7)As barrier layer was inserted above the InAs QDs to improve the confinement of QD states in the In(0.15)Ga(0.85)As DWELL structure and the device performance. The better confinement of the electronic states increases the oscillator strength of the infrared absorption. The higher excited state energy also improves the escape probability of the photoelectrons. Compared with the conventional DWELL QDIPs, the quantum efficiency increases for more than 20 times and the detectivity is an order of magnitude higher at 77 K. With better device parameters of CE-DWELL, it is possible to achieve high quantum efficiency, high operating temperature and long wavelength detection at the same time. (C) 2009 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectQuantum doten_US
dc.subjectInfrared detectoren_US
dc.subjectPhotodetectoren_US
dc.subjectIntersubbanden_US
dc.subjectDWELLen_US
dc.subjectLWIRen_US
dc.titleConfinement-enhanced dots-in-a-well QDIPs with operating temperature over 200 Ken_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.infrared.2009.05.026en_US
dc.identifier.journalINFRARED PHYSICS & TECHNOLOGYen_US
dc.citation.volume52en_US
dc.citation.issue6en_US
dc.citation.spage281en_US
dc.citation.epage284en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000273240700015-
Appears in Collections:Conferences Paper


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