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dc.contributor.authorChen, CFen_US
dc.contributor.authorLin, CLen_US
dc.contributor.authorWang, CMen_US
dc.date.accessioned2014-12-08T15:40:08Z-
dc.date.available2014-12-08T15:40:08Z-
dc.date.issued2003-11-01en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0040-6090(03)01022-8en_US
dc.identifier.urihttp://hdl.handle.net/11536/27409-
dc.description.abstractUsing CH4/H-2 source gases, vertically aligned carbon nanotubes were grown on a Cr film by microwave plasma chemical vapor deposition. The Cr film on a silicon wafer had a constant thickness of 100 nm, and bias-enhanced H, plasma pre-treatment was performed for various periods to modify the surface of the Cr film. Bias voltage of - 150 V was applied during both pre-treatment and growth steps, the resultant carbon nanotubes on a Cr film, which had been pretreated in bias-enhanced H-2 plasma for 5 min were vertically aligned. The field emission properties of the resultant carbon nanotubes included an emission current of 0.305 mA at 2 V/mum; and a turn-on field of 1.7 V/mum. (C) 2003 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectcarbonen_US
dc.subjectchemical vapor depositionen_US
dc.subjectchromiumen_US
dc.subjectfield emissionen_US
dc.titleField emission properties of vertically aligned carbon nanotubes grown on bias-enhanced hydrogen plasma-pretreated Cr filmen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0040-6090(03)01022-8en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume444en_US
dc.citation.issue1-2en_US
dc.citation.spage64en_US
dc.citation.epage69en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000186244700010-
dc.citation.woscount9-
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