完整後設資料紀錄
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dc.contributor.authorPearn, WLen_US
dc.contributor.authorYang, YSen_US
dc.date.accessioned2014-12-08T15:40:08Z-
dc.date.available2014-12-08T15:40:08Z-
dc.date.issued2003-11-01en_US
dc.identifier.issn0033-5177en_US
dc.identifier.urihttp://dx.doi.org/10.1023/A:1027331308515en_US
dc.identifier.urihttp://hdl.handle.net/11536/27413-
dc.description.abstractProcess precision index C-p has been widely used in the manufacturing industry to provide numerical measures on process potential. Pearn et al. ( 1998) considered an unbiased estimator of C-p for one single sample. They showed that the unbiased estimator is the UMVUE. They also proposed an efficient test for C-p based on one single sample, and showed that the test is the UMP test. In this paper, we consider an unbiased estimator of C-p for multiple samples. We show that the unbiased estimator is the UMVUE of C-p, which is asymptotically efficient. We also consider an efficient test for C-p, and show that the test is the UMP test for multiple samples. The practitioners can use the proposed test on their in-plant applications to obtain reliable decisions.en_US
dc.language.isoen_USen_US
dc.subjectprocess precision indexen_US
dc.subjectunbiased estimatoren_US
dc.subjectUMVUEen_US
dc.subjectasymptotically efficienten_US
dc.subjectUMP testen_US
dc.subjectp-valueen_US
dc.subjectpoweren_US
dc.titleDistributional and inferential properties of the estimated precision C-p based on multiple samplesen_US
dc.typeArticleen_US
dc.identifier.doi10.1023/A:1027331308515en_US
dc.identifier.journalQUALITY & QUANTITYen_US
dc.citation.volume37en_US
dc.citation.issue4en_US
dc.citation.spage443en_US
dc.citation.epage453en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000186412500007-
dc.citation.woscount4-
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