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dc.contributor.authorHuang, KYen_US
dc.contributor.authorLi, YMen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:40:14Z-
dc.date.available2014-12-08T15:40:14Z-
dc.date.issued2003-10-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2003.817681en_US
dc.identifier.urihttp://hdl.handle.net/11536/27474-
dc.description.abstractIn this paper, we evaluate the two-tone intermodulation distortion for heterojunction bipolar transistors (HBTs) operated at RF. We directly solve the nonlinear differential equations of the HBT large-signal model in time domain by employing the waveform-relaxation and monotone-iterative methods. Based on time-domain results, sinusoidal waveform outputs are transformed into the frequency domain with the fast Fourier transform. Furthermore, the output third-order intercept-point values of the HBT are computed with the spectra. Results for a fabricated InGaP HBT under different testing conditions are reported and compared among the HSPICE results, the results with harmonic balance methodology, and the measured data. Comparisons among these results show that our method demonstrates its superiority over the conventional approaches. This characterization alternative has allowed us to study RF device properties, perform thermal consumption and sensitivity analysis, and extract model parameters.en_US
dc.language.isoen_USen_US
dc.subjectdistortionen_US
dc.subjectheterojunction bipolar transistor (HBT)en_US
dc.subjectintermodulationen_US
dc.subjectoutput third-order intercept point (OIP3)en_US
dc.subjectRE characterizationen_US
dc.subjecttransient time analysisen_US
dc.titleA time-domain approach to simulation and characterization of RF HBT two-tone intermodulation distortionen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMTT.2003.817681en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume51en_US
dc.citation.issue10en_US
dc.citation.spage2055en_US
dc.citation.epage2062en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department友訊交大聯合研發中心zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentD Link NCTU Joint Res Ctren_US
dc.identifier.wosnumberWOS:000185719900002-
dc.citation.woscount16-
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