Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (100) YBa2Cu3O7-delta thin films

Title:	Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (100) YBa2Cu3O7-delta thin films
Authors:	Luo, CW Liu, SJ Chen, MH Wu, KH Lin, JY Chen, JM Juang, JY Uen, TM Gou, YS 電子物理學系物理研究所 Department of Electrophysics Institute of Physics
Keywords:	polarization-dependent X-ray absorption spectroscopy;a-axis oriented YBa2Cu3O7-delta;XAS of E vertical bar vertical bar a, E vertical bar vertical bar b, and E vertical bar vertical bar c
Issue Date:	1-May-2003
Abstract:	Polarization-dependent X-ray absorption spectra (XAS) on the 0 Is edge has been measured on a highly in-plane aligned (100) a-axis YBa2Cu3O7-delta (YBCO) thin films. The in-plane XAS, that is, the electric field E of the linearly polarized synchrotron light parallels to b- or c-axes of YBCO films (Eparallel tob or Eparallel toc), were obtained in a normal-incidence alignment. Furthermore, the XAS for Eparallel toa was calculated from the oblique incidence to the sample with different angles. The present results are consistent with those obtained by using detwinned YBCO single crystals. (C) 2003 Elsevier Science B.V. All rights reserved.
URI:	http://dx.doi.org/10.1016/S0921-4534(02)02561-3 http://hdl.handle.net/11536/27896
ISSN:	0921-4534
DOI:	10.1016/S0921-4534(02)02561-3
Journal:	PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS
Volume:	388
Issue:
Begin Page:	435
End Page:	436
Appears in Collections:	Conferences Paper

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