Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (100) YBa2Cu3O7-delta thin films

Abstract

Polarization-dependent X-ray absorption spectra (XAS) on the 0 Is edge has been measured on a highly in-plane aligned (100) a-axis YBa2Cu3O7-delta (YBCO) thin films. The in-plane XAS, that is, the electric field E of the linearly polarized synchrotron light parallels to b- or c-axes of YBCO films (Eparallel tob or Eparallel toc), were obtained in a normal-incidence alignment. Furthermore, the XAS for Eparallel toa was calculated from the oblique incidence to the sample with different angles. The present results are consistent with those obtained by using detwinned YBCO single crystals. (C) 2003 Elsevier Science B.V. All rights reserved.