標題: | DESIGN OF ON-CHIP POWER-RAIL ESD CLAMP CIRCUIT WITH ULTR-SMALL CAPACITANCE TO DETECT ESD TRANSITION |
作者: | Chen, Shih-Hung Ker, Ming-Dou 電機學院 College of Electrical and Computer Engineering |
公開日期: | 2009 |
摘要: | A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition. |
URI: | http://hdl.handle.net/11536/28053 |
ISBN: | 978-1-4244-2781-9 |
期刊: | 2009 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PROGRAM |
起始頁: | 327 |
結束頁: | 330 |
Appears in Collections: | Conferences Paper |