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dc.contributor.authorLee, WHen_US
dc.contributor.authorHuang, HYen_US
dc.contributor.authorChen, WCen_US
dc.contributor.authorLee, CFen_US
dc.contributor.authorChen, WKen_US
dc.contributor.authorChen, WHen_US
dc.contributor.authorLee, MCen_US
dc.date.accessioned2014-12-08T15:41:17Z-
dc.date.available2014-12-08T15:41:17Z-
dc.date.issued2003-03-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.42.L239en_US
dc.identifier.urihttp://hdl.handle.net/11536/28077-
dc.description.abstractAs-doped GaN films were grown at different temperatures by atmospheric metalorganic chemical vapor deposition. A higher electron Hall mobility, narrower line width in photoluminescence, and longer spatial correlation length of the filmes were obtainable at low growth temperatures compared to undoped GaN grown at the same temperatures as a result of isoelectronic As-doping.en_US
dc.language.isoen_USen_US
dc.subjectGaNen_US
dc.subjectisoelectronic As-dopingen_US
dc.subjectRaman scatteringen_US
dc.subjectspatial correlation lengthen_US
dc.subjectphotoluminescenceen_US
dc.subjectHall mobilityen_US
dc.titleGrowth temperature reduction for isoelectronic As-doped GaNen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.42.L239en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERSen_US
dc.citation.volume42en_US
dc.citation.issue3Aen_US
dc.citation.spageL239en_US
dc.citation.epageL242en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000184396200011-
dc.citation.woscount0-
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