統計資料
總造訪次數
| 檢視 | |
|---|---|
| Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide | 105 |
本月總瀏覽
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| 000180982000008.pdf | 7 |
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| 中國 | 96 |
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| 檢視 | |
|---|---|
| Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide | 105 |
| 檢視 | |
|---|---|
| 000180982000008.pdf | 7 |
| 檢視 | |
|---|---|
| 中國 | 96 |
| 美國 | 8 |
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Kensington | 4 |
| Menlo Park | 4 |
| Beijing | 1 |