Title: RF noise in 0.18-mu m and 0.13-mu m MOSFETs
Authors: Huang, CH
Lai, CH
Hsieh, JC
Liu, J
Chin, A
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: MOSFET;noise;RF;scaling trend;0.13 mu m
Issue Date: 1-Dec-2002
Abstract: We have studied the gate finger number and gate ength dependence on minimum noise figure (NFmin) in deep submicrometer MOSFETs. A lowest NFmin. of 0.93 dB is measured in 0.18-mum MOSFET at 5.8 GHz as increasing finger number to 50 fingers, but increases abnormally when above 50. The scaling gate length to 0.13 mum shows larger NFmin than the 0.18-mum case at the same finger number. From the analysis of a well-calibrated device model, the abnormal finger number dependence is due to the combined effect of reducing gate resistance and increasing substrate loss as increasing finger number. The scaling to 0.13-mum MOSFET gives higher NFmin due to the higher gate resistance and a modified T-gate structure proposed to optimize the NFmin for further scaling down of the MOSFET.
URI: http://dx.doi.org/10.1109/LMWC.2002.805930
http://hdl.handle.net/11536/28355
ISSN: 1531-1309
DOI: 10.1109/LMWC.2002.805930
Journal: IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Volume: 12
Issue: 12
Begin Page: 464
End Page: 466
Appears in Collections:期刊論文


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