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dc.contributor.authorHuang, DJen_US
dc.contributor.authorWu, WPen_US
dc.contributor.authorChen, Jen_US
dc.contributor.authorChang, CFen_US
dc.contributor.authorChung, SCen_US
dc.contributor.authorYuri, Men_US
dc.contributor.authorLin, HJen_US
dc.contributor.authorJohnson, PDen_US
dc.contributor.authorChen, CTen_US
dc.date.accessioned2014-12-08T15:41:46Z-
dc.date.available2014-12-08T15:41:46Z-
dc.date.issued2002-11-01en_US
dc.identifier.issn0034-6748en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1510552en_US
dc.identifier.urihttp://hdl.handle.net/11536/28391-
dc.description.abstractTo measure spin-polarized core-level electron spectra, a spectrometer equipped with a highly efficient retarding-potential Mott spin polarimeter using undulator-based soft-x-ray beamlines has been set up. With a thin film of Au as a target this polarimeter has an efficiency estimated to be similar to2x10(-4). The performance of this system for spin-polarized spectroscopy has been tested using core-level spin-polarized photoemission of magnetic and nonmagnetic thin films excited with linearly and circularly polarized light, respectively. Measurements using a new spin-resolved absorption technique are also discussed. (C) 2002 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titlePerformance of a Mott detector for undulator-based spin-resolved spectroscopyen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.1510552en_US
dc.identifier.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.citation.volume73en_US
dc.citation.issue11en_US
dc.citation.spage3778en_US
dc.citation.epage3783en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000178818200011-
dc.citation.woscount9-
Appears in Collections:Articles


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