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dc.contributor.authorHsu, HCen_US
dc.contributor.authorChen, HHen_US
dc.contributor.authorKuo, SYen_US
dc.contributor.authorChang, CSen_US
dc.contributor.authorHsieh, WFen_US
dc.date.accessioned2014-12-08T15:41:47Z-
dc.date.available2014-12-08T15:41:47Z-
dc.date.issued2002-11-01en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0040-6090(02)00743-5en_US
dc.identifier.urihttp://hdl.handle.net/11536/28407-
dc.description.abstractThe influence of annealing on the AgGaS2 films groom by pulsed laser deposition has been investigated. The X-ray diffraction results show the AgGaS2 films were found with preferential orientation (1 1 2) normal to the surface and silver droplets,were diminished after the post-annealing. Photoluminescence (PL) measurements reveled the exciton energy is slightly red shifted that is possibly due to the thermal strain effect. The binding energy of the shallow, donors is similar to28 meV determined from temperature dependent PL spectra, In addition, the A-exciton and the B/C-exciton could be observed in the transmittance spectra at room temperature. (C) 2002 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectX-ray diffractionen_US
dc.subjectphotoluminescenceen_US
dc.subjectoptical propertiesen_US
dc.titleEffect of annealing on the structural and optical properties of AgGaS2 thin films prepared by pulsed laser depositionen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0040-6090(02)00743-5en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume419en_US
dc.citation.issue1-2en_US
dc.citation.spage237en_US
dc.citation.epage241en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000179280400037-
dc.citation.woscount6-
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