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期刊論文;;Articles
INVESTIGATION OF SI-SIO2 INTERFACE PROPERTIES FOR BONDED SILICON-ON-INSULATOR
INVESTIGATION OF SI-SIO2 INTERFACE PROPERTIES FOR BONDED SILICON-ON-INSULATOR
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Date
1993-10-01
Authors
YEH, CF
KAO, HW
CHANG, BS
CHANG, KL
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https://ir.lib.nycu.edu.tw/handle/11536/2846
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