完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLi, YMen_US
dc.contributor.authorChao, TSen_US
dc.contributor.authorSze, SMen_US
dc.date.accessioned2014-12-08T15:42:10Z-
dc.date.available2014-12-08T15:42:10Z-
dc.date.issued2002-08-01en_US
dc.identifier.issn0010-4655en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0010-4655(02)00368-5en_US
dc.identifier.urihttp://hdl.handle.net/11536/28652-
dc.description.abstractIn this paper, we present a dynamic domain partition simulation technique for parallel numerical solutions of semiconductor device equations. Based on the adaptive finite volume method, a posteriori error estimation, and monotone iterative algorithm, this dynamic load balancing approach has been successfully developed and implemented on a Linux cluster with message passing interface library. The developed simulator is then applied to calculate the physical characteristics of deep submicron dynamic threshold voltage MOSFET (DTMOS). We simulate DTMOS with two different parallel algorithms: (1) 2D dynamic load balancing for parallel domain decomposition; (2) parallel I-V point simulation. Benchmark results show that a well-designed load balancing simulation can reduce the execution time up to an order of magnitude. Compared with the measured data, the simulated results for a 0.08 mum DTMOS are demonstrated to show the accuracy and efficiency of the method. (C) 2002 Elsevier Science B.V All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectsemiconductor device simulationen_US
dc.subjectDTMOSen_US
dc.subjectparallel adaptive FVMen_US
dc.subjectdynamic load balancingen_US
dc.titleA domain partition approach to parallel adaptive simulation of dynamic threshold voltage MOSFETen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/S0010-4655(02)00368-5en_US
dc.identifier.journalCOMPUTER PHYSICS COMMUNICATIONSen_US
dc.citation.volume147en_US
dc.citation.issue1-2en_US
dc.citation.spage697en_US
dc.citation.epage701en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department友訊交大聯合研發中心zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentD Link NCTU Joint Res Ctren_US
dc.identifier.wosnumberWOS:000177824600151-
顯示於類別:會議論文


文件中的檔案:

  1. 000177824600151.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。