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dc.contributor.authorPearn, WLen_US
dc.contributor.authorKo, CHen_US
dc.contributor.authorWang, KHen_US
dc.date.accessioned2014-12-08T15:42:13Z-
dc.date.available2014-12-08T15:42:13Z-
dc.date.issued2002-07-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0026-2714(02)00071-9en_US
dc.identifier.urihttp://hdl.handle.net/11536/28674-
dc.description.abstractStatistical process control charts, such as the (X) over bar, R, S-2, S, and MR charts, have been widely used in the manufacturing industry for controlling/monitoring process performance, which are essential tools for any quality improvement activities. Those charts are easy to understand, which effectively communicate critical process information without using words and formula. In this paper, we introduce a new control chart, called the C-pp multiple process performance analysis chart (MPPAC), using the incapability index C-pp. The C-pp MPPAC displays multiple processes with the departure, and process variability relative to the specification tolerances, on one single chart. We demonstrate the use of the C-pp MPPAC by presenting a case study on some resistor component manufacturing processes, to evaluate the factory performance. (C) 2002 Elsevier Science Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleA multiprocess performance analysis chart based on the incapability index C-pp: an application to the chip resistorsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0026-2714(02)00071-9en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.citation.volume42en_US
dc.citation.issue7en_US
dc.citation.spage1121en_US
dc.citation.epage1125en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000177022900017-
dc.citation.woscount11-
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