標題: Microwave penetration depth measurement for high T-c superconductors by dielectric resonators
作者: Lue, HT
Lue, JT
Tseng, TY
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-Jun-2002
摘要: The penetration depth A(T) dependence on temperatures for high T. superconducting YBa2Cu3O7-delta thin films stored in various environments was measured by a well-designed microwave dielectric resonator. A d-wave T-2 dependence was observed at low temperatures, while an exponential dependence of the penetration depth lambda(T) relevant to the s wave was detected as temperature increases due to thermal fluctuation. An abnormal upturn of the penetration depth at temperatures below 10 K attributed to the surface current carried by the defect surface-induced Andreev bound states can be apparently observed without applying heavy-ion bombardment from this relatively higher frequency measurement. Readers who endeavor to start this kind of measurement can use the well-modified dielectric cavity in conjunction with the detailed measuring procedure.
URI: http://dx.doi.org/10.1109/TIM.2002.1017712
http://hdl.handle.net/11536/28769
ISSN: 0018-9456
DOI: 10.1109/TIM.2002.1017712
期刊: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume: 51
Issue: 3
起始頁: 433
結束頁: 439
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