Analytical evaluation of the MoM matrix elements for the capacitance of a charged plate

標題:	Analytical evaluation of the MoM matrix elements for the capacitance of a charged plate
作者:	Kuo, JT Su, KY 電信工程研究所 Institute of Communications Engineering
關鍵字:	Galerkin's procedure;method of moments
公開日期:	1-May-2002
摘要:	Closed-form expression is derived for the fourfold integral involved in the evaluation of the capacitance of a charged plate using the Galerkin's procedure in the method of moments. The dimensions of each rectangular subsection for discretizing the conducting plate can be arbitrary. The calculated solutions converge faster than the point-matching results, as expected.
URI:	http://dx.doi.org/10.1109/22.999161 http://hdl.handle.net/11536/28802
ISSN:	0018-9480
DOI:	10.1109/22.999161
期刊:	IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume:	50
Issue:	5
起始頁:	1435
結束頁:	1436
Appears in Collections:	Articles

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