完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLee, JCen_US
dc.contributor.authorHung, HNen_US
dc.contributor.authorPearn, WLen_US
dc.contributor.authorKueng, TLen_US
dc.date.accessioned2014-12-08T15:42:45Z-
dc.date.available2014-12-08T15:42:45Z-
dc.date.issued2002-03-01en_US
dc.identifier.issn0748-8017en_US
dc.identifier.urihttp://dx.doi.org/10.1002/qre.450en_US
dc.identifier.urihttp://hdl.handle.net/11536/28973-
dc.description.abstractThis paper considers an asymptotic distribution for an estimate (S) over cap (pk) of the process yield index S-pk proposed by Boyles (1994). The asymptotic distribution of (S) over cap (pk) is useful in statistical inferences for S-pk. An illustrative example is given for hypothesis testing and for interval estimation on the yield index S-pk. Copyright (C) 2002 John Wiley Sons, Ltd.en_US
dc.language.isoen_USen_US
dc.subjectcentral limit theoremen_US
dc.subjectillustrative exampleen_US
dc.subjectnormal distributionen_US
dc.titleOn the distribution of the estimated process yield index S-pken_US
dc.typeArticleen_US
dc.identifier.doi10.1002/qre.450en_US
dc.identifier.journalQUALITY AND RELIABILITY ENGINEERING INTERNATIONALen_US
dc.citation.volume18en_US
dc.citation.issue2en_US
dc.citation.spage111en_US
dc.citation.epage116en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000174981800004-
dc.citation.woscount39-
顯示於類別:期刊論文


文件中的檔案:

  1. 000174981800004.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。