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dc.contributor.authorTuan, JCen_US
dc.contributor.authorChang, TSen_US
dc.contributor.authorJen, CWen_US
dc.date.accessioned2014-12-08T15:43:01Z-
dc.date.available2014-12-08T15:43:01Z-
dc.date.issued2002-01-01en_US
dc.identifier.issn1051-8215en_US
dc.identifier.urihttp://dx.doi.org/10.1109/76.981846en_US
dc.identifier.urihttp://hdl.handle.net/11536/29135-
dc.description.abstractThis work explores the data reuse properties of full-search block-matching (FSBM) for motion estimation (NEE) and associated architecture designs, as well as memory bandwidth requirements. Memory bandwidth in high-quality video is a major bottleneck to designing an implementable architecture because of large frame size and search range. First, memory bandwidth in ME is analyzed and the problem is solved by exploring data reuse. Four levels are defined according to the degree of data reuse for previous frame access. With the highest level of data reuse, one-access for frame pixels is achieved. A scheduling strategy is also applied to data reuse of ME architecture designs and a seven-type classification system is developed that can accommodate most published ME architectures. This classification can simplify the work of designers in designing more cost-effective ME architectures, while simultaneously minimizing memory bandwidth. Finally, a FSBM architecture suitable for high quality HDTV video with a minimum memory bandwidth feature is proposed. Our architecture is able to achieve 100% hardware efficiency while preserving minimum I/O pin count, low local memory size, and bandwidth.en_US
dc.language.isoen_USen_US
dc.subjectarchitectureen_US
dc.subjectblock matchingen_US
dc.subjectmemory managementen_US
dc.subjectmotion estimationen_US
dc.subjectvideo codingen_US
dc.titleOn the data reuse and memory bandwidth analysis for full-search block-matching VLSI architectureen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/76.981846en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGYen_US
dc.citation.volume12en_US
dc.citation.issue1en_US
dc.citation.spage61en_US
dc.citation.epage72en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000173716500006-
dc.citation.woscount151-
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