Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chen, YF | en_US |
| dc.contributor.author | Lan, YP | en_US |
| dc.date.accessioned | 2019-04-03T06:39:22Z | - |
| dc.date.available | 2019-04-03T06:39:22Z | - |
| dc.date.issued | 2001-12-01 | en_US |
| dc.identifier.issn | 1050-2947 | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevA.64.063807 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/29202 | - |
| dc.description.abstract | We experimentally investigate pattern formation in a solid-state microchip laser with a large Fresnel number. Controlling the reflectivity of the output coupler can generate the stable square pattern of optical vortex lattices. The formation of square vortex lattices is found to be a spontaneous process of transverse mode locking within almost-degenerated mode families. The frequency of self-induced oscillation in square vortex lattices agrees well with the numerical calculation. The chaotic relaxation oscillation is found in square vortex lattices due to the multi-longitudinal-mode operation. | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Formation of optical vortex lattices in solid-state microchip lasers: Spontaneous transverse mode locking | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | 10.1103/PhysRevA.64.063807 | en_US |
| dc.identifier.journal | PHYSICAL REVIEW A | en_US |
| dc.citation.volume | 64 | en_US |
| dc.citation.issue | 6 | en_US |
| dc.citation.spage | 0 | en_US |
| dc.citation.epage | 0 | en_US |
| dc.contributor.department | 電子物理學系 | zh_TW |
| dc.contributor.department | 光電工程研究所 | zh_TW |
| dc.contributor.department | Department of Electrophysics | en_US |
| dc.contributor.department | Institute of EO Enginerring | en_US |
| dc.identifier.wosnumber | WOS:000172608200091 | en_US |
| dc.citation.woscount | 32 | en_US |
| Appears in Collections: | Articles | |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.

