標題: Generalized interconnect delay time and crosstalk models: II. Crosstalk-induced delay time deterioration and worst crosstalk models
作者: Lee, TGY
Tseng, TY
Wong, SC
Yang, CJ
Liang, MS
Cheng, HC
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: closed-form model;interconnect;model;crosstalk-enhanced delay;delay;crosstalk;worst case;optimization
公開日期: 1-Dec-2001
摘要: New analytical models for estimating crosstalk-induced delay time deterioration and the worst crosstalk models of a coupled interconnect for ramp input waveform are derived. The accuracy of these compact models at various driver resistances, loading capacitances, and input-ramping rates is verified by simulation program with integrated circuit emphasis (SPICE) simulation for the parallel interconnect system. The effects of crosstalk noise on the delay time at various ramp input rise times, for both simultaneous and non-simultaneous switching cases, are discussed here. In this study we show that crosstalk noise will be a limiting factor for future fast transition signals. The results reported herein are useful in the studies of delay time uncertainties due to noise and the interconnect worst-case design.
URI: http://hdl.handle.net/11536/29212
ISSN: 0021-4922
期刊: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
Volume: 40
Issue: 12
起始頁: 6694
結束頁: 6699
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