標題: | Central fringe identification by phase quadrature interferometric technique and tunable laser-diode |
作者: | Lee, JY Su, DC 光電工程學系 Department of Photonics |
關鍵字: | central fringe;quadrature interferometry;white-light interferometry |
公開日期: | 1-十一月-2001 |
摘要: | When the optical path difference is not zero, the phase of the interferogram is strongly influenced by the wavelength variation of the light source. Under this condition, the phase variation can be estimated with a phase quadrature interferometric technique. And the central fringe of the interferogram can be identified as the, phase variation remains unchanged. Based on this fact, an improved method to identify the central fringe is presented. It has some merits, such as simple optical setup, easier operation in real time, inexpensive, ability to judge which arm of interferometer is longer, etc. The feasibility is demonstrated with 10 nm resolution. (C) 2001 Elsevier Science B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/S0030-4018(01)01515-2 http://hdl.handle.net/11536/29297 |
ISSN: | 0030-4018 |
DOI: | 10.1016/S0030-4018(01)01515-2 |
期刊: | OPTICS COMMUNICATIONS |
Volume: | 198 |
Issue: | 4-6 |
起始頁: | 333 |
結束頁: | 337 |
顯示於類別: | 期刊論文 |