標題: High resolution central fringe identification
作者: Lee, JY
Su, DC
光電工程學系
Department of Photonics
關鍵字: central fringe;heterodyne interferometry
公開日期: 1-十一月-1998
摘要: A high resolution central fringe identification by using the heterodyne interferometry with a tunable laser-diode and a fixed wavelength laser is presented. It can be operated easily and can be used to judge which arm of the Michelson interferometer is longer. The feasibility is demonstrated and it has 0.2 nm resolution. (C) 1998 Elsevier Science B.V. All rights reserved.
URI: http://hdl.handle.net/11536/31786
ISSN: 0030-4018
期刊: OPTICS COMMUNICATIONS
Volume: 156
Issue: 1-3
起始頁: 1
結束頁: 4
顯示於類別:期刊論文


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