標題: | High resolution central fringe identification |
作者: | Lee, JY Su, DC 光電工程學系 Department of Photonics |
關鍵字: | central fringe;heterodyne interferometry |
公開日期: | 1-十一月-1998 |
摘要: | A high resolution central fringe identification by using the heterodyne interferometry with a tunable laser-diode and a fixed wavelength laser is presented. It can be operated easily and can be used to judge which arm of the Michelson interferometer is longer. The feasibility is demonstrated and it has 0.2 nm resolution. (C) 1998 Elsevier Science B.V. All rights reserved. |
URI: | http://hdl.handle.net/11536/31786 |
ISSN: | 0030-4018 |
期刊: | OPTICS COMMUNICATIONS |
Volume: | 156 |
Issue: | 1-3 |
起始頁: | 1 |
結束頁: | 4 |
顯示於類別: | 期刊論文 |