標題: Electron field emission properties on ultra-nano-crystalline diamond coated silicon nanowires
作者: Tzeng, Yu-Fen
Lee, Chi-Young
Chiu, Hsin-Tien
Tai, Nyan-Hwa
Lin, I-Nan
應用化學系
Department of Applied Chemistry
關鍵字: electron field emission properties;ultra-nano-crystalline diamond (UNCD);silicon nanowires (SiNWs);UNCD nano-emitters
公開日期: 1-Jul-2008
摘要: Ultra-nano-crystal line diamond (UNCD) nano-emitters were prepared by coating UNCD films on the tip of silicon nanowire (SiNW) templates by microwave plasma-enhanced chemical vapor deposition process. The electron field emission properties of the UNCD/SiNW nano-emitters varied markedly with the pre-seeding process for the SiNW-templates. The direct ultrasonication process is more efficient in the formation of the diamond nuclei than the carburization/ultrasonication process, yielding UNCD/SiNWs nano-emitters with better electron field emission properties. The electron field emission can be turned on at (E(0))(UNCD/SiNW4)= 3.75 V/mu m, yielding a large electron field emission current density of (Je)(UNCD/SiNW4)= 11.22 mA/cm(2) at an applied field of 9.75 V/mu m. These characteristics are significantly better than those of bare SiNWs or planar UNCD films. (C) 2008 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.diamond.2008.03.023
http://hdl.handle.net/11536/29298
ISSN: 0925-9635
DOI: 10.1016/j.diamond.2008.03.023
期刊: DIAMOND AND RELATED MATERIALS
Volume: 17
Issue: 7-10
起始頁: 1817
結束頁: 1820
Appears in Collections:Conferences Paper


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