完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen, SH | en_US |
dc.contributor.author | Chen, YF | en_US |
dc.date.accessioned | 2014-12-08T15:43:18Z | - |
dc.date.available | 2014-12-08T15:43:18Z | - |
dc.date.issued | 2001-11-01 | en_US |
dc.identifier.issn | 1071-1023 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1116/1.1421555 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/29302 | - |
dc.description.abstract | An atomic force, microscope operated in tapping mode using a homemade bent optical fiber probe was used to pattern nanometer-scale features. Trenches of different dimensions were written on polycarbonate that was pre-exposed to an excimer laser. Lines with widths varying from 260 to 600 nm and depths ranging from 30 to 120 nm have been made. The present technique as a complementary tool to other lithographic processes has been demonstrated to be potentially suitable for low-cost and high-precision applications. (C) 2001 American Vacuum Society. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Nanostructure patterns written in polycarbonate by a bent optical fiber probe | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1116/1.1421555 | en_US |
dc.identifier.journal | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | en_US |
dc.citation.volume | 19 | en_US |
dc.citation.issue | 6 | en_US |
dc.citation.spage | 2299 | en_US |
dc.citation.epage | 2300 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000173159900049 | - |
dc.citation.woscount | 1 | - |
顯示於類別: | 期刊論文 |