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dc.contributor.authorLIU, DCen_US
dc.contributor.authorLEE, CPen_US
dc.contributor.authorTSAI, CMen_US
dc.contributor.authorLEI, TFen_US
dc.contributor.authorTSANG, JSen_US
dc.contributor.authorCHIANG, WHen_US
dc.contributor.authorTU, YKen_US
dc.date.accessioned2014-12-08T15:04:29Z-
dc.date.available2014-12-08T15:04:29Z-
dc.date.issued1993-06-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.353917en_US
dc.identifier.urihttp://hdl.handle.net/11536/2980-
dc.description.abstractThe influences of cladding layer thicknesses on the performance of strained-layer InGaAs/GaAs graded-index separated confinement heterostructure quantum well lasers have been studied. The waveguiding property of the laser structure was analyzed using the transfer matrix method. In this work, experimental results and the calculated results showed that threshold current densities and external quantum efficiencies both were crucially dependent on the thicknesses of cladding layer for both single and multiple quantum well lasers. The minimum cladding layer thicknesses needed to maintain low threshold current densities and low internal total loss for both single and multiple quantum well devices were determined experimentally and theoretically.en_US
dc.language.isoen_USen_US
dc.titleROLE OF CLADDING LAYER THICKNESSES ON STRAINED-LAYER INGAAS/GAAS SINGLE AND MULTIPLE-QUANTUM-WELL LASERSen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.353917en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume73en_US
dc.citation.issue12en_US
dc.citation.spage8027en_US
dc.citation.epage8034en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1993LH22900003-
dc.citation.woscount12-
顯示於類別:期刊論文