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dc.contributor.authorNayak, Men_US
dc.contributor.authorLee, SYen_US
dc.contributor.authorTseng, TYen_US
dc.date.accessioned2014-12-08T15:44:20Z-
dc.date.available2014-12-08T15:44:20Z-
dc.date.issued2001en_US
dc.identifier.issn0015-0193en_US
dc.identifier.urihttp://hdl.handle.net/11536/29943-
dc.identifier.urihttp://dx.doi.org/10.1080/00150190108008744en_US
dc.description.abstractBarium strontium titanate thin films with composition (Ba0.5Sr0.5)TiO3 were prepared by a sot-gel method using hydroxide-alkoxide precursors. Reasonably well-crystallized film was obtained at a temperature as low as 500 degreesC. The leakage current characteristics and dielectric constant of the films varied with the annealing temperature due to the change in microstructure. The electrical and dielectric properties of the films showed strong dependence on the precursor solution concentration. Dielectric response of the films prepared from dilute solution is superior to that prepared from the concentrated solution. The change in electrical and dielectric characteristics of the films has been correlated to their microstructure, which revealed that the concentration change affected the grain size distribution, film porosity and morphology.en_US
dc.language.isoen_USen_US
dc.subjectsol-gelen_US
dc.subjectthin filmen_US
dc.subjectbarium strontium titanate (BST)en_US
dc.subjectdielectric constanten_US
dc.titleSol-gel derived (Ba0.5Sr0.5)TiO3 thin films and their electrical and dielectric propertiesen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1080/00150190108008744en_US
dc.identifier.journalFERROELECTRICSen_US
dc.citation.volume259en_US
dc.citation.issue1-4en_US
dc.citation.spage239en_US
dc.citation.epage249en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000177215200038-
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