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dc.contributor.authorLo, M. H.en_US
dc.contributor.authorLi, Z. Y.en_US
dc.contributor.authorChen, J. R.en_US
dc.contributor.authorKo, T. S.en_US
dc.contributor.authorLu, T. C.en_US
dc.contributor.authorKuo, H. C.en_US
dc.contributor.authorWang, S. C.en_US
dc.date.accessioned2014-12-08T15:45:04Z-
dc.date.available2014-12-08T15:45:04Z-
dc.date.issued2008en_US
dc.identifier.isbn978-0-8194-7069-0en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/30398-
dc.identifier.urihttp://dx.doi.org/10.1117/12.762158en_US
dc.description.abstractA three-pair AlGaN/GaN multiple quantum well (MQW) structure with superlattices (SLs) was grown on c-plane sapphire using metal organic chemical vapor deposition (MOCVD) system. The AlGaN barrier and GaN well of the MQW structure were grown by atomic layer deposition (ALD) and conventional growth, respectively. The HRTEM and HRXRD results show the grown structure has shape interface between SLs layers and QWs with good periodicity. The AFM and SEM data show smooth surface morphology with low RMS value and low defect density. The CL measurements also indicate uniform luminescence pattern at room temperature. The AlGaN/GaN MQW with AlN/GaN SLs structure grown by ALD could be used to improve the surface morphology by effectively suppress the threading dislocation.en_US
dc.language.isoen_USen_US
dc.subjectatomic layer depositionen_US
dc.subjectAlGaNen_US
dc.subjectUVen_US
dc.subjectquantum wellen_US
dc.titleAlGaN/GaN multiple quantum wells grown by atomic layer deposition - art. no. 68941Ven_US
dc.typeArticleen_US
dc.identifier.doi10.1117/12.762158en_US
dc.identifier.journalGALLIUM NITRIDE MATERIALS AND DEVICES IIIen_US
dc.citation.volume6894en_US
dc.citation.spageV8941en_US
dc.citation.epageV8941en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000254733800043-
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