RHEED intensity oscillations in homoepitaxial growth of SrTiO3 films

標題:	RHEED intensity oscillations in homoepitaxial growth of SrTiO3 films
作者:	Lee, JY Juang, JY Ou, JH Chen, YF Wu, KH Uen, TM Gou, YS 電子物理學系 Department of Electrophysics
關鍵字:	homoepitaxial SrTiO3 thin film;RHEED;epitaxial growth;atomic force microscopy
公開日期:	1-Jul-2000
摘要:	The amplitude and periodicity of the reflection high-energy electron diffraction (RHEED) oscillations displayed strong temperature dependence in homoepitaxy of SrTiO3(STO) films. Combining with the AFM observations, the results suggest that the oscillations are not directly related to the layer-by-layer growth. (C) 2000 Elsevier Science B.V. All rights reserved.
URI:	http://dx.doi.org/10.1016/S0921-4526(99)02981-6 http://hdl.handle.net/11536/30415
ISSN:	0921-4526
DOI:	10.1016/S0921-4526(99)02981-6
期刊:	PHYSICA B
Volume:	284
Issue:
起始頁:	2099
結束頁:	2100
Appears in Collections:	Conferences Paper

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