Title: A method for measuring two-dimensional refractive index distribution by using Fresnel equations and phase-shifting interferometry
Authors: Hsieh, H. C.
Jian, Z. C.
Chen, Y. L.
Hsieh, P. J.
Su, D. C.
光電工程學系
Department of Photonics
Issue Date: 2008
Abstract: Based tin Fresnel equations and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. A linearly polarized light passes through a quarter wave-plate and is incident on the tested material. The reflected light propagates through an analyzer, and then the interference signal can be obtained. The special equations to estimate the phase of the interferometric signal can be derived by using Fresnel equations. Next, the associated two-dimensional phase distribution is measured by the four-step phase-shifting interferometry. Then, the measured data are substituted into the special equations derived previously, and the two-dimensional refractive index distribution of the tested material can be obtained.
URI: http://hdl.handle.net/11536/30486
http://dx.doi.org/10.1002/pssc.200777735
ISSN: 1610-1634
DOI: 10.1002/pssc.200777735
Journal: PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5
Volume: 5
Issue: 5
Begin Page: 1016
End Page: 1019
Appears in Collections:Conferences Paper


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