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dc.contributor.authorHsieh, H. C.en_US
dc.contributor.authorJian, Z. C.en_US
dc.contributor.authorChen, Y. L.en_US
dc.contributor.authorHsieh, P. J.en_US
dc.contributor.authorSu, D. C.en_US
dc.date.accessioned2014-12-08T15:45:14Z-
dc.date.available2014-12-08T15:45:14Z-
dc.date.issued2008en_US
dc.identifier.issn1610-1634en_US
dc.identifier.urihttp://hdl.handle.net/11536/30486-
dc.identifier.urihttp://dx.doi.org/10.1002/pssc.200777735en_US
dc.description.abstractBased tin Fresnel equations and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented. A linearly polarized light passes through a quarter wave-plate and is incident on the tested material. The reflected light propagates through an analyzer, and then the interference signal can be obtained. The special equations to estimate the phase of the interferometric signal can be derived by using Fresnel equations. Next, the associated two-dimensional phase distribution is measured by the four-step phase-shifting interferometry. Then, the measured data are substituted into the special equations derived previously, and the two-dimensional refractive index distribution of the tested material can be obtained.en_US
dc.language.isoen_USen_US
dc.titleA method for measuring two-dimensional refractive index distribution by using Fresnel equations and phase-shifting interferometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/pssc.200777735en_US
dc.identifier.journalPHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5en_US
dc.citation.volume5en_US
dc.citation.issue5en_US
dc.citation.spage1016en_US
dc.citation.epage1019en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000256862500004-
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