Decay rate and renormalized frequency shift of superradiant excitons: Crossover from two-dimensional to three-dimensional crystals

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DC 欄位	值	語言
dc.contributor.author	Chen, YN	en_US
dc.contributor.author	Chuu, DS	en_US
dc.date.accessioned	2019-04-03T06:39:34Z	-
dc.date.available	2019-04-03T06:39:34Z	-
dc.date.issued	2000-04-15	en_US
dc.identifier.issn	1098-0121	en_US
dc.identifier.uri	http://dx.doi.org/10.1103/PhysRevB.61.10815	en_US
dc.identifier.uri	http://hdl.handle.net/11536/30577	-
dc.description.abstract	The superradiant decay rate and renormalized frequency shift of Wannier excitons in a semiconductor film of N layers are studied. It is found that both the decay rate and renormalized frequency shift show oscillatory dependence on layer thickness. The crossover from the superradiant exciton to the bulk polariton when varying N from 1 to infinity is also examined.	en_US
dc.language.iso	en_US	en_US
dc.title	Decay rate and renormalized frequency shift of superradiant excitons: Crossover from two-dimensional to three-dimensional crystals	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1103/PhysRevB.61.10815	en_US
dc.identifier.journal	PHYSICAL REVIEW B	en_US
dc.citation.volume	61	en_US
dc.citation.issue	16	en_US
dc.citation.spage	10815	en_US
dc.citation.epage	10819	en_US
dc.contributor.department	電子物理學系	zh_TW
dc.contributor.department	Department of Electrophysics	en_US
dc.identifier.wosnumber	WOS:000086755600043	en_US
dc.citation.woscount	11	en_US
顯示於類別：	期刊論文

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