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dc.contributor.authorChen, YNen_US
dc.contributor.authorChuu, DSen_US
dc.date.accessioned2019-04-03T06:39:34Z-
dc.date.available2019-04-03T06:39:34Z-
dc.date.issued2000-04-15en_US
dc.identifier.issn1098-0121en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.61.10815en_US
dc.identifier.urihttp://hdl.handle.net/11536/30577-
dc.description.abstractThe superradiant decay rate and renormalized frequency shift of Wannier excitons in a semiconductor film of N layers are studied. It is found that both the decay rate and renormalized frequency shift show oscillatory dependence on layer thickness. The crossover from the superradiant exciton to the bulk polariton when varying N from 1 to infinity is also examined.en_US
dc.language.isoen_USen_US
dc.titleDecay rate and renormalized frequency shift of superradiant excitons: Crossover from two-dimensional to three-dimensional crystalsen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.61.10815en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume61en_US
dc.citation.issue16en_US
dc.citation.spage10815en_US
dc.citation.epage10819en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000086755600043en_US
dc.citation.woscount11en_US
Appears in Collections:Articles


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