標題: | Fluctuation-enhanced conductivity in YBa2Cu2Ox (6.5 <= x <= 6.95) and Tl2Ba2Ca2Cu3O10 +/-delta |
作者: | Juang, JY Hsieh, MC Luo, CW Uen, TM Wu, KH Gou, YS 電子物理學系 Department of Electrophysics |
關鍵字: | fluctuation effects;oxygen stoichiometry;Cu-chains;coherence length |
公開日期: | 1-一月-2000 |
摘要: | The fluctuation-induced conductivity (Delta sigma(T)) near T-c of a sole YBa2Cu3Ox (YBCO) film with various precisely controlled oxygen contents (6.5 less than or equal to x less than or equal to 6.95) was studied and compared with those obtained from its Tl-based counterparts. For YBCO films with x > 6.7, Delta sigma (T) displays a distinct 3D to 2D crossover as the temperature approaches T-c. On the other hand, as T -->T-c, Delta sigma (T) of both Tl-based and YBCO film with x less than or equal to 6.7 exhibits a reversed 2D to 3D crossover. It is suggestive that the coupling between the CuO2 layers may have changed significantly with reducing oxygen. (C) 2000 Elsevier Science B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/S0921-4534(99)00566-3 http://hdl.handle.net/11536/30830 |
ISSN: | 0921-4534 |
DOI: | 10.1016/S0921-4534(99)00566-3 |
期刊: | PHYSICA C |
Volume: | 329 |
Issue: | 1 |
起始頁: | 45 |
結束頁: | 50 |
顯示於類別: | 期刊論文 |