標題: ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR
作者: Ker, Ming-Dou
Lin, Chun-Yu
Meng, Guo-Xuan
電機學院
College of Electrical and Computer Engineering
公開日期: 2008
摘要: Waffle-structured SCR (silicon-controlled rectifier) has been studied as an effective on-chip ESD (electrostatic discharge) protection device for CMOS RIF (radio-frequency) circuits. In this work, a novel on-chip ESD protection strategy using the waffle-structured SCR is proposed and co-designed with a CMOS UWB (ultra-wideband) PA (power amplifier). Before ESD stress, the RIF performances of the ESD-protected PA have been demonstrated to be as well as that of the unprotected PA. After ESD stress, the unprotected PA was seriously degraded, whereas the ESD-protected PA was keeping the performances well.
URI: http://hdl.handle.net/11536/31020
ISBN: 978-1-4244-2078-0
ISSN: 0271-4302
期刊: PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10
起始頁: 1292
結束頁: 1295
顯示於類別:會議論文