標題: | Characteristics of SiC-based thin-film LED fabricated using plasma-enhanced CVD system with stainless steel mesh |
作者: | Chen, YA Hsu, ML Laih, LH Hong, JW Chang, CY 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 22-七月-1999 |
摘要: | A conventional plasma-enhanced chemical vapour deposition (PECVD) system with a stainless steel mesh attached to a cathode was used to fabricate an SiC-based thin-mm light-emitting diode (TFLED) at a low temperature (similar to 180 degrees C). The obtained TFLED had a brightness (B) of 1060cd/m(2) at an injection current density (J) of 600mA/cm(2) and a threshold voltage (V-th) of 12.6V, which were much better than those of 330cd/m(2) and 18.5V for an amorphous SiC-based TFLED fabricated by the same PECVD system without a stainless steel mesh. |
URI: | http://dx.doi.org/10.1049/el:19990786 http://hdl.handle.net/11536/31199 |
ISSN: | 0013-5194 |
DOI: | 10.1049/el:19990786 |
期刊: | ELECTRONICS LETTERS |
Volume: | 35 |
Issue: | 15 |
起始頁: | 1274 |
結束頁: | 1275 |
顯示於類別: | 期刊論文 |