标题: | Complex refractive-index measurement based on Fresnel's equations and the uses of heterodyne interferometry |
作者: | Chiu, MH Lee, JY Su, DC 光电工程学系 Department of Photonics |
公开日期: | 1-七月-1999 |
摘要: | The phase difference between s and p polarization of the light reflected from a material is used for measuring the material's complex refractive index. First, two phase differences that correspond to two different incidence angles are measured by heterodyne interferometry. Then these two phase differences are substituted into Fresnel's equations, and a set of simultaneous equations is obtained. Finally, the equations are solved by use of a personal computer by a numerical analysis technique, and the complex refractive index of the material can be estimated. (C) 1999 Optical Society of America. |
URI: | http://hdl.handle.net/11536/31224 |
ISSN: | 0003-6935 |
期刊: | APPLIED OPTICS |
Volume: | 38 |
Issue: | 19 |
起始页: | 4047 |
结束页: | 4052 |
显示于类别: | Articles |
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