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dc.contributor.authorLo, PCen_US
dc.date.accessioned2014-12-08T15:46:37Z-
dc.date.available2014-12-08T15:46:37Z-
dc.date.issued1999-05-01en_US
dc.identifier.issn0018-9294en_US
dc.identifier.urihttp://dx.doi.org/10.1109/10.759058en_US
dc.identifier.urihttp://hdl.handle.net/11536/31354-
dc.description.abstractThe spatial distribution of electroencephalogram (EEG) features on the scalp surface, both in time or frequency, is of great importance in clinical applications and medical research. Traditionally, mathematical methods based on interpolation algorithms have been widely applied to obtain the EEG mappings, This paper presents an innovative approach to reconstructing the brain potential mappings from multichannel EEG's, The three-dimensional (3-D) filtering approach, differing from the numerical interpolating methods, considers the spatial distribution of brain potentials as a 3-D signal, which is processed and interpolated according to its spatial frequency characteristics, The performance of the 3-D filtering method evaluated on simulated brain potentials is shown to be comparable to the four-nearest-neighbors method. Moreover, the 3-D filtering method is superior to the spherical splines method in efficiency. Two main advantages of this method are: the prospect of developing realtime, animated EEG mappings utilizing powerful digital signal processors and its capability of processing and interpolating the brain potentials on the realistic irregular scalp surface.en_US
dc.language.isoen_USen_US
dc.subjectbrain potential mappingen_US
dc.subjectelectroencephalography (EEGen_US
dc.subjectEEG mappingen_US
dc.subjectinterpolation methodsen_US
dc.subjectmultidimensional digital signalen_US
dc.subjectthree-dimensional (3-D) digital filter design by frequency transformation methoden_US
dc.titleThree-dimensional filtering approach to brain potential mappingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/10.759058en_US
dc.identifier.journalIEEE TRANSACTIONS ON BIOMEDICAL ENGINEERINGen_US
dc.citation.volume46en_US
dc.citation.issue5en_US
dc.citation.spage574en_US
dc.citation.epage583en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000079961000010-
dc.citation.woscount6-
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