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dc.contributor.authorLai, JHen_US
dc.contributor.authorLin, CTen_US
dc.date.accessioned2014-12-08T15:46:42Z-
dc.date.available2014-12-08T15:46:42Z-
dc.date.issued1999-04-01en_US
dc.identifier.issn1063-6706en_US
dc.identifier.urihttp://dx.doi.org/10.1109/91.755398en_US
dc.identifier.urihttp://hdl.handle.net/11536/31407-
dc.description.abstractTemperature measurement and control are two difficult problems in the rapid thermal processing (RTP) system. For many applications such as rapid thermal processing chemical vapor deposition (RTCVD) [1] and rapid thermal oxidation (RTO) [2], large changes in wafer emissivity can occur during film growing, leading to erroneous temperature measurements with a single wavelength pyrometer. The error in the inferred temperature will affect the temperature control of the RTP system. In order to correct the temperature reading of the pyrometer, a neural fuzzy network is used to predict the emissivity changes for the compensation of measured temperature. As for the temperature control, to overcome ill performance of the temperature tracking system due to the inaccuracy of the identified model, another neural fuzzy network is used in the RTP system for learning inverse control simultaneously. The key advantage of neural fuzzy approach over traditional ones lies on that the approach does not require a mathematical description of the system while performing pyrometer correction and temperature control. Simulation results show that the adopted neural fuzzy networks can not only correct the pyrometer reading accurately, but also be able to track a temperature trajectory very well.en_US
dc.language.isoen_USen_US
dc.subjectemissivityen_US
dc.subjectfeedforward learningen_US
dc.subjectinverse controlen_US
dc.subjecttemperature measurementen_US
dc.subjectTSK fuzzy rulesen_US
dc.subjectwaferen_US
dc.titleApplication of neural fuzzy network to pyrometer correction and temperature control in rapid thermal processingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/91.755398en_US
dc.identifier.journalIEEE TRANSACTIONS ON FUZZY SYSTEMSen_US
dc.citation.volume7en_US
dc.citation.issue2en_US
dc.citation.spage160en_US
dc.citation.epage175en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000079777100006-
dc.citation.woscount9-
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