標題: Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices
作者: Lin, Y. F.
Jian, W. B.
Wu, Z. Y.
Chen, F. R.
Kai, J. J.
Lin, J. J.
電子物理學系
Department of Electrophysics
公開日期: 2008
摘要: Cylindrical ZnO nanowires were synthesized to fabricate two-contact ZnO nanowire devices with the same separation distance between the two contact electrodes. Electrical properties including temperature dependence of resistance and I-V curves were recorded. According to distinct electrical behaviors and room-temperatare resistance, ZnO nanowire devices can be categorized into three different types exhibiting either contact or intrinsic NW attributes.
URI: http://hdl.handle.net/11536/31431
http://dx.doi.org/10.1109/INEC.2008.4585677
ISBN: 978-1-4244-1572-4
DOI: 10.1109/INEC.2008.4585677
期刊: 2008 2ND IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1-3
起始頁: 1112
結束頁: 1115
顯示於類別:會議論文


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