| 標題: | Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices |
| 作者: | Lin, Y. F. Jian, W. B. Wu, Z. Y. Chen, F. R. Kai, J. J. Lin, J. J. 電子物理學系 Department of Electrophysics |
| 公開日期: | 2008 |
| 摘要: | Cylindrical ZnO nanowires were synthesized to fabricate two-contact ZnO nanowire devices with the same separation distance between the two contact electrodes. Electrical properties including temperature dependence of resistance and I-V curves were recorded. According to distinct electrical behaviors and room-temperatare resistance, ZnO nanowire devices can be categorized into three different types exhibiting either contact or intrinsic NW attributes. |
| URI: | http://hdl.handle.net/11536/31431 http://dx.doi.org/10.1109/INEC.2008.4585677 |
| ISBN: | 978-1-4244-1572-4 |
| DOI: | 10.1109/INEC.2008.4585677 |
| 期刊: | 2008 2ND IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1-3 |
| 起始頁: | 1112 |
| 結束頁: | 1115 |
| 顯示於類別: | 會議論文 |

