標題: | Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices |
作者: | Lin, Y. F. Jian, W. B. Wu, Z. Y. Chen, F. R. Kai, J. J. Lin, J. J. 電子物理學系 Department of Electrophysics |
公開日期: | 2008 |
摘要: | Cylindrical ZnO nanowires were synthesized to fabricate two-contact ZnO nanowire devices with the same separation distance between the two contact electrodes. Electrical properties including temperature dependence of resistance and I-V curves were recorded. According to distinct electrical behaviors and room-temperatare resistance, ZnO nanowire devices can be categorized into three different types exhibiting either contact or intrinsic NW attributes. |
URI: | http://hdl.handle.net/11536/31431 http://dx.doi.org/10.1109/INEC.2008.4585677 |
ISBN: | 978-1-4244-1572-4 |
DOI: | 10.1109/INEC.2008.4585677 |
期刊: | 2008 2ND IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1-3 |
起始頁: | 1112 |
結束頁: | 1115 |
Appears in Collections: | Conferences Paper |
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