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dc.contributor.authorWu, CCen_US
dc.contributor.authorLin, CJen_US
dc.date.accessioned2014-12-08T15:46:50Z-
dc.date.available2014-12-08T15:46:50Z-
dc.date.issued1999-03-01en_US
dc.identifier.issn0921-4526en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0921-4526(98)01220-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/31483-
dc.description.abstractThe free-carrier absorption in n-type InSb films has been studied for quantum well structures fabricated from III-V semiconducting materials where the polar optical phonon scattering is predominant. We consider here two special cases: the electromagnetic radiation is polarized parallel to the layer plane and perpendicular to the layer plane separately. The energy band of electrons in semiconductors is assumed to be nonparabolic. Results show that when the electromagnetic radiation is polarized parallel to the layer plane, the free-carrier absorption coefficient is independent of temperature in a small quantum well region such as d < 30 Angstrom, but the absorption coefficient oscillates with the quantum well and depends upon the temperature in the region of larger quantum wells. When the electromagnetic radiation is polarized perpendicular to the layer plane, the dependence of the free-carrier absorption coefficient on the quantum well and temperature becomes quite complicated. (C) 1999 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectfree-carrier absorptionen_US
dc.subjectoptical phonon scatteringen_US
dc.subjectelectromagnetic radiationen_US
dc.titleEffect of nonparabolicity on free-carrier absorption in n-type InSb films for polar optical phonon scatteringen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/S0921-4526(98)01220-4en_US
dc.identifier.journalPHYSICA Ben_US
dc.citation.volume263en_US
dc.citation.issueen_US
dc.citation.spage208en_US
dc.citation.epage210en_US
dc.contributor.department應用數學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Applied Mathematicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000079362700056-
Appears in Collections:Conferences Paper


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