SOME PROCESS CAPABILITY INDEXES ARE MORE RELIABLE THAN ONE MIGHT THINK

doi:10.2307/2347409

Full metadata record

DC Field	Value	Language
dc.contributor.author	KOTZ, S	en_US
dc.contributor.author	PEARN, WL	en_US
dc.contributor.author	JOHNSON, NL	en_US
dc.date.accessioned	2014-12-08T15:04:40Z	-
dc.date.available	2014-12-08T15:04:40Z	-
dc.date.issued	1993	en_US
dc.identifier.issn	0035-9254	en_US
dc.identifier.uri	http://hdl.handle.net/11536/3157	-
dc.identifier.uri	http://dx.doi.org/10.2307/2347409	en_US
dc.description.abstract	In this paper we obtain formulae for exact expected values and standard deviations of estimators of certain process capability indices discussed by Bissell. In particular, we show that for the index C(pk) Bissell's formula gives values for the standard deviation which are too high especially when the actual population mean value is close to (or equal to) the average of the upper and lower specification limits.	en_US
dc.language.iso	en_US	en_US
dc.subject	CAPABILITY INDEXES	en_US
dc.subject	NONCENTRAL CHI-2-DISTRIBUTION	en_US
dc.subject	STANDARD ERROR	en_US
dc.subject	STIRLING APPROXIMATION	en_US
dc.title	SOME PROCESS CAPABILITY INDEXES ARE MORE RELIABLE THAN ONE MIGHT THINK	en_US
dc.type	Article	en_US
dc.identifier.doi	10.2307/2347409	en_US
dc.identifier.journal	APPLIED STATISTICS-JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C	en_US
dc.citation.volume	42	en_US
dc.citation.issue	1	en_US
dc.citation.spage	55	en_US
dc.citation.epage	62	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.identifier.wosnumber	WOS:A1993KJ08500005	-
dc.citation.woscount	41	-
Appears in Collections:	Articles

Files in This Item:

A1993KJ08500005.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.