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dc.contributor.authorChen, HHen_US
dc.contributor.authorChung, SJen_US
dc.date.accessioned2014-12-08T15:47:15Z-
dc.date.available2014-12-08T15:47:15Z-
dc.date.issued1998-12-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/22.739293en_US
dc.identifier.urihttp://hdl.handle.net/11536/31702-
dc.description.abstractA partially sealed package formed by two metal diaphragms with or without an absorber is proposed and analyzed for shielded microstrip-line circuits. The mode-matching method, method of lines, and finite-element method are mixed appropriately to investigate the package. For a specific analysis, an electric current filament and a microstrip-line gap are chosen to simulate, respectively, an active circuit element (CE) and a passive CE to be packaged. The suppression effect of the package on the spurious (higher order) modes and the influence on the dominant mode are fully studied by comparing the excitation and scattering characteristics of the CE's with and without the package.en_US
dc.language.isoen_USen_US
dc.subjectmetal diaphragmsen_US
dc.subjectpackaged microstrip lineen_US
dc.subjectpartially sealed cavityen_US
dc.subjectspurious modesen_US
dc.titleAnalysis of a partially sealed package for microstrip-line circuitsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/22.739293en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume46en_US
dc.citation.issue12en_US
dc.citation.spage2124en_US
dc.citation.epage2130en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000078098700020-
dc.citation.woscount2-
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